200kV FEI Tecnai F20 UT(monochromated)

The 200kV FEI monochromated F20 UT Tecnai is an instrument designed to produce the optimum high resolution performance in both TEM and STEM. In addition, the incorporation of a monochromator into the gun permits electron energy loss spectroscopy to be performed with an energy resolution of ~0.15eV. This microscope features a 2048x2048 CCD camera positioned after the Gatan Imaging Filter (GIF) that can be used for both dedicated spectroscopic analysis and energy filtered imaging. This microscope is optimized for materials applications that require either the highest resolution STEM performance (imaging and spectroscopy) or correlated imaging and analytical methods (TEM and STEM). The complete list of specifications is provided below, along with several examples of the types of images and spectra that can be obtained from this microscope. Future developments will also incorporate 3-D tomographic methods in both high resolution STEM and TEM. This microscope has been installed and extensively used in National Center for Electron Microscopy(NCEM) at LBNL. Contacts: Nigel Browning and Chris Nelson.

Specifications:

Accel. Voltage:
200 (and 120) kV
Spherical Aberration Cs:
0.5 mm
Chromatic Aberration Cc: 1.1 mm

HRTEM:

Scherzer resolution
0.19 nm
Information limit (monochromator off)
0.12 nm

STEM:

Spatial Resolution:Monochromator off
0.14 nm
Monochromator on
1.0 nm

EELS:

Energy Resolution
Monochromator off
500 meV
Monochromator on
150 meV

JEOL JEM-2500SE

The new JEM-2500SE is an easy-to-use STEM designed for professional researchers who demand efficiency and high performance. The JEM-2500SE works like a SEM , but provides the high-resolution results of a TEM. It is being installed and tested in the Materials Science Central Facilities at UC-Davis.

Its features include:


Specifications:

Accelerating Voltage
Range
200 kV

Magnification
on 18-inch LCD
x100-10,000,000

HRTEM:

60-500mm
2-stage electromagnetic deflection
condenser lens variable aperture
objective lens variable aperture
selected-area variable aperture
all motorized

STEM:

Spatial Resolution:

Resolution
Lattice Image
0.2nm

Specimen Movement:

X Direction
Y Direction
Z Direction
¡À1.0mm
¡À1.0mm
¡À0.5mm