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FACULTY · WEB TOOLS

David Howitt
Photo of Dr. Howitt email: dghowitt@ucdavis.edu
Office: 2011 Kemper Hall
Phone: (530)752-1164
Professor
B.A., 1972, Oxford
M.S., 1974, University of California, Berkeley
Ph.D., 1976, University of California, Berkeley

Research

Forensics and failure analysis:
The analysis of the materials involved in an incident can often contribute to the understanding of what occurred and in some cases can procide critical evidence for criminal or civil prosecution. The development of techniques of analysis as well as the evaluation of some of the accepted methodologies, particularly with respect to fire and accidents are being pursued using both theoretical and experimental methods.

Radiation Effects:
The study of electron irradiation effects in the electron microscope has led to the understanding of materials behavior in applications extending from electron beam lithography to the stability of materials in fusion reactors and electron beam accelerators. These programs are continuing with an emphasis on the behavior of dielectric materials and the role of electric fields.

Materials Bonding:
These research efforts are directed towards the development of silicon and high-band-gap semiconductor devices for electronic and optical systems. Studies include the evaluation of different bonding processes as well as the measurement of bond strengths and continuity at the interfaces.

Thin Film Materials:
The preparation and study of thin-film materials, particularly boron nitride and diamond, is an ongoing program with the Sandia National laboratory. The properties of these thin films and the determination of the characteristics of film growth are investigated by electron microscopy.

Image Calculation:
The determination of the signal produced by a specimen in the scanning electron microscope can be determined by Monte Carlo methods even for the most complicated of specimen geometries. Our studies include the determination of quantitative signals such as emitted X-rays and backscattered signals as well as the characteristics of three-dimensional images and the retrieval of quantitative information about topography.

Materials Deformation:
The basic mechanisms of plastic deformation in shock-loaded ceramics, particularly sapphire, magnesium oxide, and silicon are being investigated in order to understand the way in which glide processes can be induced in brittle ceramics.

Support

Department of Energy
Sandia
Industry


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Chemical Engineering and Materials Science Department